EFEITOS DA ABERRAÇÃO CROMÁTICA LONGITUDINAL E DA TEMPERATURA SOBRE O ESPALHAMENTO RAMAN CONFOCAL DE GRAFENO

Abstract

Raman scattering phenomena has far been widely used as an experimental methodology for probing materials properties. In the last decade, the combination of microscopy and spectroscopy aspects has been largely used in the study of materials in low dimensions, especially carbon nanotubes and graphene. Graphene is a two-dimensional material that has one hexagonal structure. Due to its excellent crystalline quality, this material has shown great prospects of strategic applications in the near future. The majority of the studies reported on graphene are carried out by using confocal microscopes, which relies on the longitudinal chromatic aberration. This optical effect is related to intrinsic limitation of any lens to focus light with different wavelength at the same focal plane. In this work, we examine the effect of longitudinal chromatic aberration and also the effect of irradiance on the Raman spectra of graphene. Consistent with the results of literature, we found that the intensity of the Raman signal for the G mode increases linearly with the number of layers, up to the limit of six layers identified in our samples. We also found a strong dependence of the Raman intensity with longitudinal chromatic aberration. Owing to this effect, the intensity of the G peak was underestimated in about 20%, while the intensity of G peak appeared 56% below the real value. Measurement performed to confirm the effect of longitudinal chromatic aberration showed an aberration of 1,8 μm/eV for Raman scattering and 2,0 μm/eV by using pure reflectometry. Measurements in graphene with defects revealed a strong dependence of peak frequency with focal position and laser power as well. Changes of 6 cm-1 in G' mode was observed for laser power between 44 e 175 μW.